Testing Solutions for Your Manufacturing Needs
Tell us about your requirements — we’ll deliver the precise analysis you need.
Accurate surface contamination analysis with fast turnaround times
Comprehensive TXRF analysis for silicon wafers with industry-leading detection limits and rapid turnaround times.
State-of-the-art equipment and expertise delivering reliable results you can trust.
Tell us about your requirements — we’ll deliver the precise analysis you need.
We accept both 150mm and 200mm bare Si, SiC, and non-Si substrates, allowing for a wide range of applications.
Detection limits are element dependent, ranging from 1×10⁹ to 1×10¹² atoms/cm², with the capability to achieve lower detection limits upon request for specialized applications.
Dedicated to delivering accurate information in a timely manner, ensuring your production schedules stay on track.
Our TXRF testing methodology is completely non-destructive, preserving your wafers for further processing or analysis.
Comprehensive detection capability for elements from Sodium (Na) to Uranium (U) on reflective surfaces.
We accept orders of any size at competitive pricing, making professional TXRF analysis accessible for all production scales.
We are a company dedicated to TXRF testing of bare Si and non-Si substrates to identify surface elemental contamination. Located in Cambridge, Massachusetts, we combine cutting-edge technology with expert analysis to deliver precise results that drive your semiconductor manufacturing forward.
Our Rigaku TXRF 3760 system provides industry-leading accuracy for surface contamination detection, ensuring your wafers meet the highest quality standards.
We understand the importance of fast turnaround times in semiconductor manufacturing. Our streamlined processes ensure you receive results when you need them.
Our team brings deep expertise in TXRF analysis and semiconductor research, providing insights that go beyond raw data.
We utilize the Rigaku TXRF 3760, a state-of-the-art total reflection X-ray fluorescence spectrometer
designed specifically for semiconductor wafer analysis. This advanced instrumentation enables us to
achieve exceptional detection limits and provide comprehensive elemental analysis.
Whether you need single wafer analysis or high-volume testing — we’re here to support your quality control needs.